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Local Probes of Nanoscale Devices
Publications
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- C. Staii, R. Shao, D. Bonnell,
and A.T. Johnson, High frequency Scanning Gate Microscopy and
local memory effect of carbon nanotube field effect transistors,
Nano Letters 5, 893 – 896 (2005).
- C. Staii, N.J. Pinto, A.T.
Johnson, Jr, Scanning Conductance Microscopy
of Carbon Nanotubes and Polyethylene Oxide Nanofibers,
page 129-132, Proceedings of the XVIII International Winterschool
on Electronic Properties of Novel Materials, Kirchberg, Austria,
2004, AIP Conference Proceedings 723 (Melville, New York, 2004).
- C. Staii,
N.J. Pinto, and A.T. Johnson, Quantitative analysis of Scanning
Conductance Microscopy, Nano Letters 4, 859 – 862 (2004).
- A.T. Johnson, M. Freitag, M.
Radosavljevic, S.V. Kalinin, and D.A. Bonnell, Role of defects
in carbon nanotube circuits, International Journal of
Nanoscience 1, 247 – 254 (2002).
- A.T. Johnson, Memory effect
and role of defects in carbon nanotube field effect transistors,
page 526 – 530, Proceedings of the XVI International Winterschool,
Kirchberg, Tyrol, 2002, AIP Conference Proceedings 633 (Melville,
New York, 2002).
- M. Freitag
and A.T. Johnson, Nanoscale characterization of carbon nanotube
field-effect transistors, page 513 – 516, Proceedings of the
XVI International Winterschool, Kirchberg, Tyrol, 2002, AIP
Conference Proceedings 633 (Melville, New York, 2002).
- Sergei V. Kalinin, Dawn A.
Bonnell, Marcus Freitag, and A.T. Johnson, Tip-gating effect in
scanning impedance microscopy of nanoelectronic devices,
Applied Physics Letters 81 , 5219 – 5221 (2002).
- Marcus
Freitag, Sergei V. Kalinin, Dawn A. Bonnell, and A.T. Johnson,
Role of single defects in electronic transport through carbon
nanotube field effect transistors, Physical Review Letters 89,
216801 (2002).
- Sergei V. Kalinin, Marcus
Freitag, A.T. Johnson, and Dawn A. Bonnell, Carbon nanotubes as
a tip calibration standard for electrostatic scanning probe
microscopies, Applied Physics Letters 81, 754 – 756 (2002).
- Marcus Freitag and A.T.
Johnson, Imaging Schottky barriers at carbon nanotube contacts,
Proceedings of the Fall Meeting of the Materials Research Society,
November 2001.
- M. Freitag, M. Radosavljevic,
Y. Zhou, A.T. Johnson, and W.F. Smith, Controlled creation of a
carbon nanotube diode using a scanned gate, Applied Physics
Letters 79, 3326 – 3328 (2001). I am the corresponding author on
this paper.
- M. Freitag and A.T. Johnson,
Locally measured electronic properties of single wall carbon
nanotubes, to appear in proceedings of the XIV International
Winger School, Kirchberg, Tyrol, 2000, edited by Hans Kuzmany,
Jörg Fink, Michael Mehring, and Siegmar Roth (AIP Conference
Proceedings, Woodbury, New York).
- M. Freitag, M. Radosavljevic,
W. Clauss and A.T. Johnson, Local electronic properties of
single wall carbon nanotube circuits measured by conducting-tip
AFM, Physical Review B62 R2307 – R2310 (2000).
- W. Clauss, M. Freitag, D.J.
Bergeron, and A.T. Johnson, Material contrast by combined
scanning tunneling and force microscopy imaging of single walled
carbon nanotubes, Carbon 38, 1735 – 1739 (2000).
- W. Clauss, J. Zhang, D.J.
Bergeron, and A.T. Johnson, Application and calibration of a
quartz needle sensor for high resolution scanning force microscopy,
Journal of Vacuum Science and Technology 17, 1309-1312 (1999).
- W. Clauss, D.J. Bergeron, M.
Freitag, C.L. Kane, E.J. Mele, and A.T. Johnson, Electron
backscattering on single-wall carbon nanotubes observed by
scanning tunneling microscopy, Europhysics Letters 47, 601-607
(1999).
- W. Clauss, D. J. Bergeron, and
A. T. Johnson, Atomic resolution STM imaging of a twisted
single-wall carbon nanotube, Physical Review B58, R4266-R4269
(1998).
- J. Lefebvre, R. Antonov, and
A.T. Johnson, STM morphology study of ropes of single-wall
carbon nanotubes, Appl. Phys. A 67, 71-74 (1998).
- Wilfried Clauss, David J.
Bergeron, and A.T. Johnson, Observation of elastic deformations
in single-walled carbon nanotubes by scanning tunneling
microscopy, pages 92-96 in Electronic properties of novel
materials-progress in molecular nanostructures, proceedings of
the XII International Winter School, Kirchberg, Tyrol, 1998,
edited by Hans Kuzmany, Jörg Fink, Michael Mehring, and Siegmar
Roth (AIP Conference Proceedings 442, Woodbury, New York).
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