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Molecular Electronics Local Probes of Nanoscale Systems Chemical and Biological Sensing Nanotube and Nanowire Electronics

 
Local Probes of Nanoscale Devices Publications
  • C. Staii, R. Shao, D. Bonnell, and A.T. Johnson, High frequency Scanning Gate Microscopy and local memory effect of carbon nanotube field effect transistors, Nano Letters 5, 893 – 896 (2005).
     
  • C. Staii, N.J. Pinto, A.T. Johnson, Jr, Scanning Conductance Microscopy of Carbon Nanotubes and Polyethylene Oxide Nanofibers, page 129-132, Proceedings of the XVIII International Winterschool on Electronic Properties of Novel Materials, Kirchberg, Austria, 2004, AIP Conference Proceedings 723 (Melville, New York, 2004).
     
  • C. Staii, N.J. Pinto, and A.T. Johnson, Quantitative analysis of Scanning Conductance Microscopy, Nano Letters 4, 859 – 862 (2004).
     
  • A.T. Johnson, M. Freitag, M. Radosavljevic, S.V. Kalinin, and D.A. Bonnell, Role of defects in carbon nanotube circuits, International Journal of Nanoscience 1, 247 – 254 (2002).
     
  • A.T. Johnson, Memory effect and role of defects in carbon nanotube field effect transistors, page 526 – 530, Proceedings of the XVI International Winterschool, Kirchberg, Tyrol, 2002, AIP Conference Proceedings 633 (Melville, New York, 2002).
     
  • M. Freitag and A.T. Johnson, Nanoscale characterization of carbon nanotube field-effect transistors, page 513 – 516, Proceedings of the XVI International Winterschool, Kirchberg, Tyrol, 2002, AIP Conference Proceedings 633 (Melville, New York, 2002).
     
  • Sergei V. Kalinin, Dawn A. Bonnell, Marcus Freitag, and A.T. Johnson, Tip-gating effect in scanning impedance microscopy of nanoelectronic devices, Applied Physics Letters 81 , 5219 – 5221 (2002).
     
  • Marcus Freitag, Sergei V. Kalinin, Dawn A. Bonnell, and A.T. Johnson, Role of single defects in electronic transport through carbon nanotube field effect transistors, Physical Review Letters 89, 216801 (2002).
     
  • Sergei V. Kalinin, Marcus Freitag, A.T. Johnson, and Dawn A. Bonnell, Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies, Applied Physics Letters 81, 754 – 756 (2002).
     
  • Marcus Freitag and A.T. Johnson, Imaging Schottky barriers at carbon nanotube contacts, Proceedings of the Fall Meeting of the Materials Research Society, November 2001.
     
  • M. Freitag, M. Radosavljevic, Y. Zhou, A.T. Johnson, and W.F. Smith, Controlled creation of a carbon nanotube diode using a scanned gate, Applied Physics Letters 79, 3326 – 3328 (2001). I am the corresponding author on this paper.
     
  • M. Freitag and A.T. Johnson, Locally measured electronic properties of single wall carbon nanotubes, to appear in proceedings of the XIV International Winger School, Kirchberg, Tyrol, 2000, edited by Hans Kuzmany, Jörg Fink, Michael Mehring, and Siegmar Roth (AIP Conference Proceedings, Woodbury, New York).
     
  • M. Freitag, M. Radosavljevic, W. Clauss and A.T. Johnson, Local electronic properties of single wall carbon nanotube circuits measured by conducting-tip AFM, Physical Review B62 R2307 – R2310 (2000).
     
  • W. Clauss, M. Freitag, D.J. Bergeron, and A.T. Johnson, Material contrast by combined scanning tunneling and force microscopy imaging of single walled carbon nanotubes, Carbon 38, 1735 – 1739 (2000).
     
  • W. Clauss, J. Zhang, D.J. Bergeron, and A.T. Johnson, Application and calibration of a quartz needle sensor for high resolution scanning force microscopy, Journal of Vacuum Science and Technology 17, 1309-1312 (1999).
     
  • W. Clauss, D.J. Bergeron, M. Freitag, C.L. Kane, E.J. Mele, and A.T. Johnson, Electron backscattering on single-wall carbon nanotubes observed by scanning tunneling microscopy, Europhysics Letters 47, 601-607 (1999).
     
  • W. Clauss, D. J. Bergeron, and A. T. Johnson, Atomic resolution STM imaging of a twisted single-wall carbon nanotube, Physical Review B58, R4266-R4269 (1998).
     
  • J. Lefebvre, R. Antonov, and A.T. Johnson, STM morphology study of ropes of single-wall carbon nanotubes, Appl. Phys. A 67, 71-74 (1998).
     
  • Wilfried Clauss, David J. Bergeron, and A.T. Johnson, Observation of elastic deformations in single-walled carbon nanotubes by scanning tunneling microscopy,  pages 92-96 in Electronic properties of novel materials-progress in molecular nanostructures, proceedings of the XII International Winter School, Kirchberg, Tyrol, 1998, edited by Hans Kuzmany, Jörg Fink, Michael Mehring, and Siegmar Roth (AIP Conference Proceedings 442, Woodbury, New York).

     

     

Page last modified on November 8, 2005